Embryonic Architecture with Built-in Self-test and GA Evolved Configuration Data

Gayatri Malhotra, Punithavathi Duraiswamy, J.K. Kishore

Abstract


The embryonic architecture, which draws inspiration
from the biological process of ontogeny, has built-in
mechanisms for self-repair. The entire genome is stored in the
embryonic cells, allowing the data to be replicated in healthy
cells in the event of a single cell failure in the embryonic fabric.
A specially designed genetic algorithm (GA) is used to evolve the
configuration information for embryonic cells. Any failed embryonic
cell must be indicated via the proposed Built-in Self-test
(BIST) the module of the embryonic fabric. This paper recommends
an effective centralized BIST design for a novel embryonic fabric.
Every embryonic cell is scanned by the proposed BIST in case
the self-test mode is activated. The centralized BIST design uses
less hardware than if it were integrated into each embryonic
cell. To reduce the size of the data, the genome or configuration
data of each embryonic cell is decoded using Cartesian Genetic
Programming (CGP). The GA is tested for the 1-bit adder and
2-bit comparator circuits that are implemented in the embryonic
cell. Fault detection is possible at every function of the cell due to
the BIST module’s design. The CGP format can also offer gate-level
fault detection. Customized GA and BIST are combined
with the novel embryonic architecture. In the embryonic cell, self-repair
is accomplished via data scrubbing for transient errors.


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