2024-03-29T14:52:01Z
http://ijet.pl/index.php/ijet/oai
oai:ojs.ijet.ise.pw.edu.pl:article/524
2016-03-30T07:27:52Z
ijet:EDITOR
nmb a2200000Iu 4500
"160330 2016 eng "
2300-1933
dc
EDITORIAL
Hrynkiewicz, Edward
Institute of Electronics
Silesian University of Technology,
IFAC and IEEE International Conference on Programmable Devices and Embedded Systems (PDeS) is organized every 18 months in cooperation of the Institute of Electronics of Silesian University of Technology in Gliwice (Poland), the Faculty of Electrical Engineering and Computer Science of the University of Ostrava (Czech Republic) and Electrical Engineering and Communication of the Brno University of Technology. The 2015 year event was hosted in Cracow by Institute of Electronics of Silesian University of Technology. This event was unique opportunity to celebrate 20 years of PDeS meetings since its beginning in 1995.
After careful analysis and review, the International Program Committee of PDeS 2015 has selected 81 regular papers for presentation at the Conference sessions and later publication. Six outstanding papers has been select for publishing in the International Journal of Electronics and Telecommunication. Selected papers illustrate the conference hot topics covering problems of logic synthesis, digital system modeling, algorithms for signal and image processing, medical systems design and implementation. The authors of selected papers have prepared new extended versions containing their recent research results in these fields. I thank the authors for the effort and I hope that the papers will be interesting for the readers.
Electronics and Telecommunications Committee
2016-03-30 09:14:09
application/pdf
http://ijet.pl/index.php/ijet/article/view/524
International Journal of Electronics and Telecommunications; Vol 62, No 1 (2016)
eng
Copyright (c) 2016 International Journal of Electronics and Telecommunications
oai:ojs.ijet.ise.pw.edu.pl:article/261
2015-03-31T11:08:29Z
ijet:EDITOR
nmb a2200000Iu 4500
"150316 2015 eng "
2300-1933
dc
Editorial - Electronic Circuits Testing
Strzelecki, Michał
Lodz University of Technology //eletel.eu/mstrzel
Hałgas, Stanisław
Lodz University of Technology
We greatly appreciate the opportunity to highlight the topic of electronic circuits testing by the International Journal of Electronics and Telecommunications.
Imperfections in the manufacturing process requires testing of hardware-implemented circuits and their components. The increasing complexity of such systems makes this issue more and more demanding. The main objective of testing is to distinguish between good and faulty ones. This objective can be achieved in several ways, e.g. by functional or structural testing. Either analog or digital, fault detection or location in electronic systems is usually performed by analysis of measurements results acquired from a limited number of inputs and outputs. This problem becomes near critical with the advent VLSI and ULSI components. For more than five decades, the subject of fault location in analog and mixed-signal circuits has been of interest to researchers. In recent ten years this interest has been intensified significantly. The device and voltage scaling scenarios for present and future nanometer CMOS technologies cause that the attention will shift to testing defects that did not exist before or that were not relevant in the past.
...
Electronics and Telecommunications Committee
2015-03-31 13:02:37
application/pdf
http://ijet.pl/index.php/ijet/article/view/261
International Journal of Electronics and Telecommunications; Vol 61, No 1 (2015)
eng
Copyright (c)
oai:ojs.ijet.ise.pw.edu.pl:article/377
2015-09-23T20:16:34Z
ijet:EDITOR
nmb a2200000Iu 4500
"150826 2015 eng "
2300-1933
dc
Editorial
Łaszczyk, Jan
Academy of Special Education
Editorial to e-learning section
Electronics and Telecommunications Committee
2015-09-23 15:44:05
application/pdf
http://ijet.pl/index.php/ijet/article/view/377
International Journal of Electronics and Telecommunications; Vol 61, No 3 (2015)
eng
Copyright (c)