Krawczyk, Rafal, Institute of Electronics Systems Warsaw University of Technology CERN, 1211 Geneva 23,Switzerland, Poland

• Vol 67, No 1 (2021) - Fusion, HEP and XFEL electronics
  Soft X-ray diagnostic system upgrades and data quality monitoring features for tokamak usage
  Abstract  PDF

International Journal of Electronics and Telecommunications
is a periodical of Electronics and Telecommunications Committee
of Polish Academy of Sciences

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