Editorial - Electronic Circuits Testing

Authors

  • Michał Strzelecki Lodz University of Technology
  • Stanisław Hałgas Lodz University of Technology

Abstract

We greatly appreciate the opportunity to highlight the topic of electronic circuits testing by the International Journal of Electronics and Telecommunications.


Imperfections in the manufacturing process requires testing of hardware-implemented circuits and their components. The increasing complexity of such systems makes this issue more and more demanding. The main objective of testing is to distinguish between good and faulty ones. This objective can be achieved in several ways, e.g. by functional or structural testing. Either analog or digital, fault detection or location in electronic systems is usually performed by analysis of measurements results acquired from a limited number of inputs and outputs. This problem becomes near critical with the advent VLSI and ULSI components. For more than five decades, the subject of fault location in analog and mixed-signal circuits has been of interest to researchers. In recent ten years this interest has been intensified significantly. The device and voltage scaling scenarios for present and future nanometer CMOS technologies cause that the attention will shift to testing defects that did not exist before or that were not relevant in the past.

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Published

2015-03-16

Issue

Section

Editorial